Scanning ion conductance microscopy
Situation: Scanning ion conductance microscopy, a type of scanning probe microscopy, requires multiple ADC and DAC inputs and outputs to control piezoelectric and conventional motors, as well as very small ion currents to nanometre precision at speed.
Challenge: Users want to create experiment-specific scans and pipette manipulations as well as using standard commercial software. So they are using lots of different devices and software packages, which all need to be able to speak the same language.
Solution: A SPM IOI-run commercial Ionscope software quickly allowing the user to perform standard SICM scans, while the ScriptML interface gives the user powerful tools to create novel scan patterns and pipette control.